Scanning capacitance microscopy of ErAs nanoparticles embedded in GaAs pn junctions

Applied Physics Letters

Volumn 99, Issue 13, 2011, Pages

  Park, K W ^a   Nair, H P ^a   Crook, A M ^a   Bank, S R ^a   Yu, E T ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE MODULATION; FERMI LEVEL PINNING; GAAS; IMAGE DATA; INHOMOGENEITIES; LATERAL LENGTH; NANO SCALE; NUMERICAL MODELING; P-N JUNCTION; PARTICLE RADII; RESOLUTION LIMITS; SCANNING CAPACITANCE MICROSCOPY;

CAPACITANCE; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; GALLIUM ARSENIDE; MOLECULAR BEAM EPITAXY; SCANNING; SEMICONDUCTING GALLIUM;

NANOPARTICLES;

EID: 80053493338     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3644144     Document Type: Article

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