The world's thinnest superconductor

ChemPhysChem

Volumn 10, Issue 18, 2009, Pages 3183-3185

  Weitering, Hanno H ^a,b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Lead; Scanning probe microscopy; Silicon; Superconductors; Thin films

Indexed keywords

LEAD; SCANNING PROBE MICROSCOPY; SILICON; THIN FILMS;

DIMENSIONAL CONTROL; DOUBLE LAYERS; LEAD ATOM; MESOSCOPIC SUPERCONDUCTIVITY; NANO-SCALE SUPERCONDUCTORS;

SUPERCONDUCTING MATERIALS;

EID: 80053400470     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.200900663     Document Type: Review

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