Bragg coherent diffraction imaging of epitaxial nanostructures using focused hard X-ray ptychography

AIP Conference Proceedings

Volumn 1365, Issue , 2010, Pages 235-238

  Hruszkewycz, S O ^a   Holt, M V ^a   Proffit, D L ^a,b   Highland, M J ^a   Imre, A ^a   Maser, J ^a   Eastman, J A ^a   Bai, G R ^a   Fuoss, P H ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b Northwestern University   (United States)

Author keywords

bismuth oxide; Coherent diffraction; focused hard x rays; Hard X ray Nanoprobe

Indexed keywords

EID: 80053320814     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3625347     Document Type: Conference Paper

References (11)

1. J. M. Rodenburg et al., Phys. Rev. Lett., 98, 034801 (2007).
2. P. Thibault et al., Ultramicroscopy 109, 338 (2009).
3. B. Abbey et al., Nat. Phys. 4, 394 (2008).
4. M. C. Newton et al., Nat. Mater. 9, 120 (2010).
5. I. K. Robinson et al., Nat. Mater. 8, 291 (2009).
6. A. Azad et al., J. Mater. Sci. 8, 4135 (1994).
7. D. L. Proffit et al., Appl. Phys. Lett. 96, 021905 (2010).
8. A. Schropp et al., Appl. Phys. Lett. 96, 091102 (2010).
9. D. Shu, SRI-2010, AIP Conf. Proc. 1234, 263 (2009).
10. D. Shu et al., Nucl. Instrum. Methods A 582, 159 (2007).
11. th Int. Conf. X-ray Microscopy, IPAP 7, 26 (2006).