Dynamics of a disturbed sessile drop measured by atomic force microscopy (AFM)

Langmuir

Volumn 27, Issue 19, 2011, Pages 11966-11972

  McGuiggan, Patricia M ^a   Grave, Daniel A ^a   Wallace, Jay S ^c   Cheng, Shengfeng ^d   Prosperetti, Andrea ^a   Robbins, Mark O ^a,b  

^a Johns Hopkins University   (United States)

^b JOHNS HOPKINS UNIVERSITY   (United States)

^c MACS Consulting   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADJUSTABLE PARAMETERS; AFM; CAPILLARY FORCE; DROP VOLUME; LIQUID INTERFACE; LIQUID SURFACE; NORMAL MODES; ORDERS OF MAGNITUDE; RESONANCE MODE; RESONANCE OSCILLATION; SENSITIVE MEASUREMENT; SESSILE DROPS; SESSILE WATER;

ATOMIC FORCE MICROSCOPY; DYNAMICS; LIQUIDS; MICROSPHERES; SPHERES; SURFACE TENSION;

DROPS;

POLITEF;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL PHENOMENA; CHEMISTRY; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; THERMODYNAMICS;

HYDROPHOBIC AND HYDROPHILIC INTERACTIONS; MICROSCOPY, ATOMIC FORCE; PARTICLE SIZE; POLYTETRAFLUOROETHYLENE; SURFACE PROPERTIES; THERMODYNAMICS;

EID: 80053318865     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la2023709     Document Type: Article

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