Maximum force technique for the measurement of the surface tension of a small droplet by AFM

Journal of Adhesion

Volumn 82, Issue 10, 2006, Pages 997-1011

  McGuiggan, Patricia M ^a   Wallace, Jay S ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b MACS Consulting   (United States)

Author keywords

AFM; Contact angle; Hysteresis; Nanoscale; Surface tension; Wetting

Indexed keywords

CETYL TRIMETHYL AMMONIUM BROMIDE; MENISCUS FORCE; TETRADECANE; VERTICAL QUARTZ ROD;

CONTACT ANGLE; HYSTERESIS; INTERFACES (MATERIALS); LIQUIDS; SURFACE TENSION; WETTING;

ATOMIC FORCE MICROSCOPY;

EID: 33749678063     PISSN: 00218464     EISSN: 15455823     Source Type: Journal    
DOI: 10.1080/00218460600876225     Document Type: Article

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23. 'Official contribution of the National Institute of Standards and Technology; not subject to copyright in the United States.'
24. One of a Collection of papers honoring Hugh R. Brown, who received The Adhesion Society Award for Excellence in Adhesion Science, Sponsored by 3M, in February 2006.