Voltammetric behavior of gold nanotrench electrodes

Langmuir

Volumn 27, Issue 19, 2011, Pages 12218-12225

  Guerrette, Joshua P ^a   Percival, Stephen J ^a   Zhang, Bo ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC SIGNALS; ANALYTICAL EXPRESSIONS; ANALYTICAL MODEL; DELAMINATION CRACK; DIFFUSION-LIMITED CURRENT; ELECTROCHEMICAL RESPONSE; FINITE ELEMENT SIMULATIONS; GLASS/EPOXY; MASS-TRANSPORT RESISTANCE; NACL SOLUTION; QUASI-STEADY STATE; SCAN RATES; SMOOTHING EFFECTS; VOLTAMMETRIC BEHAVIORS; VOLTAMMETRIC RESPONSE;

COMPUTER SIMULATION; CYCLIC VOLTAMMETRY; FABRICATION; FINITE ELEMENT METHOD; GOLD; MATHEMATICAL MODELS; SODIUM CHLORIDE;

ELECTROCHEMICAL ELECTRODES;

EPOXIDE; GLASS; GOLD; METAL NANOPARTICLE;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTRODE; PARTICLE SIZE; SURFACE PROPERTY;

ELECTROCHEMISTRY; ELECTRODES; EPOXY COMPOUNDS; GLASS; GOLD; METAL NANOPARTICLES; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 80053314378     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la2023743     Document Type: Article

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