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Volumn 321, Issue , 2011, Pages 234-239

Edge isolation using ultra-short pulse laser materials with a top-hat beam profile

Author keywords

Edge isolation; Silicon solar cells; Top hat; Ultra short pulse laser

Indexed keywords

BEAM PROFILES; COMPARATIVE STUDIES; CRYSTALLINE SILICON SOLAR CELLS; EDGE ISOLATION; ELECTRICAL PERFORMANCE; GAUSSIANS; INDUSTRIAL SOLUTIONS; ISOLATION PROCESS; LASER FOCUS; LASER GROOVING; LASER PULSE WIDTH; LASER WAVELENGTH; MATERIAL REMOVAL; SOLAR CELL JUNCTIONS; TOP-HAT; ULTRA-SHORT PULSE LASER;

EID: 80053199056     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMR.321.234     Document Type: Conference Paper
Times cited : (1)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.