Strong higher order mutation-based test data generation

SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering

Volumn , Issue , 2011, Pages 212-222

  Harman, Mark ^a   Jia, Yue ^a   Langdon, William B ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Mutation testing; Test data generation

Indexed keywords

DYNAMIC SYMBOLIC EXECUTIONS; EMPIRICAL STUDIES; HIGHER ORDER; INDUSTRIAL CODES; MUTATION TESTING; OPEN-SOURCE CODE; SEARCH-BASED; TEST DATA GENERATION;

DATA COMMUNICATION SYSTEMS; OPEN SYSTEMS; SEARCH ENGINES; SOFTWARE ENGINEERING;

SOFTWARE TESTING;

EID: 80053197346     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2025113.2025144     Document Type: Conference Paper

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