Electronic properties of nanoscale silver crystals at the interface of silver thick film contacts on n-type silicon

Applied Physics Letters

Volumn 97, Issue 19, 2010, Pages

  Kontermann, Stefan ^a   Willeke, Gerhard ^a   Bauer, Jan ^b  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT TRANSPORT; CURRENT TRANSPORT MECHANISM; DIRECT CONTACT; N TYPE SILICON; NANOSCALE SILVER; ORDERS OF MAGNITUDE; SILVER CRYSTALS; SPECIFIC CONTACT RESISTANCES; THEORETICAL VALUES; THICK-FILM CONTACT;

CONTACT RESISTANCE; CRYSTALS; ELECTRONIC PROPERTIES; THICK FILMS;

SILVER;

EID: 78249249994     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3508950     Document Type: Article

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