A framework for defect prediction in specific software project contexts

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 4980 LNCS, Issue , 2011, Pages 261-274

  Wahyudin, Dindin ^a   Ramler, Rudolf ^b   Biffl, Stefan ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b SOFTWARE COMPETENCE CENTER HAGENBERG   (Austria)

Author keywords

Metric based Defect Prediction; Software Defect Prediction; Systematical Literature Review

Indexed keywords

DEFECT PREDICTION; EMPIRICAL SOFTWARE ENGINEERING; LITERATURE REVIEWS; PREDICTION MODEL; PROJECT MANAGERS; SOFTWARE DEFECT PREDICTION; SOFTWARE PROJECT; SYSTEMATIC LITERATURE REVIEW;

DEFECTS; FORECASTING; MATHEMATICAL MODELS; PROJECT MANAGEMENT; SOFTWARE ENGINEERING;

COMPUTER SOFTWARE MAINTENANCE; FORECASTING;

EID: 80053135701     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-22386-0_20     Document Type: Conference Paper

References (28)

1. Basili, V., Caldiera, G., Rombach, H.D.: The Goal Question Metric Approach. 2, 6 (1994)
2. Fenton, N., Neil, M.: A Critique of Software Defect Prediction Models. IEEE Trans. Softw. Eng. 25, 15 (1999)
3. Graves, T.L., Karr, A.F., Marron, J.S., Siy, H.: Predicting fault incidence using software change history. IEEE Transactions on Software Engineering 26, 8 (2000)
4. Khoshgoftaar, T., Bhattacharyya, B., Richardson, G.: Predicting Software Errors, During Development, Using Nonlinear Regression Models: A Comparative Study. IEEE Transaction on Reliability 41, 5 (1992)
5. Kitchenham, B.: Guidelines for performing Systematic Literature Reviews in Software Engineering (2007)
6. Kitchenham, B., Kutay, C., Jeffery, R., Connaughton, C.: Lessons learnt from the analysis of large-scale corporate databases. In: Proceedings of the 28th International Conference on Software Engineering. ACM, Shanghai (2006)
7. Kitchenham, B.A., Mendes, E., Travassos, G.H.: Cross versus Within-Company Cost Estimation Studies: A Systematic Review. IEEE Transactions on Software Engineering 33, 316-329 (2007)
8. Koru, A.G., Hongfang, L.: Building Defect Prediction Models in Practice. IEEE Softw. 22, 23-29 (2005)
9. Li, P.L., Herbsleb, J., Shaw, M.: Forecasting Field Defect Rates Using a Combined Time-Based and Metrics-Based Approach: A Case Study of OpenBSD. In: The 16th IEEE International Symposium on Software Reliability Engineering, IEEE Computer Society, Los Alamitos (2005)
10. Li, P.L., Herbsleb, J., Shaw, M., Robinson, B.: Experiences and results from initiating field defect prediction and product test prioritization efforts at ABB Inc. In: Proceedings of the 28th International Conference on Software Engineering. ACM, Shanghai (2006)
11. Li, P.L., Herbsleb, J., Shaw, M., Robinson, B.: Experiences and results from initiating field defect prediction and product test prioritization efforts at ABB Inc. In: The 28th International Conference on Software Engineering. ACM, Shanghai (2006)
12. Menzies, T., Di Stefano, J., Ammar, K., McGill, K., Callis, P., Chapman, R., Davis, J.: When Can We Test Less? In: Proceedings of the 9th International Symposium on Software Metrics. IEEE Computer Society, Los Alamitos (2003)
13. Menzies, T., Greenwald, J., Frank, A.: Data Mining Static Code Attributes to Learn Defect Predictors. IEEE Transactions on Software Engineering 33, 2-13 (2007)
14. Moser, R., Pedrycz, W., Succi, G.: A Comparative Analysis of the Efficiency of Change Metrics and Static Code Attributes for Defect Prediction. In: The 30th International Conference on Software Engineering. ACM, Leipzig (2008)
15. Nachtsheim, C.J., Kutner, M.H.: Applied Linear Regression Models. McGraw-Hill Education, New York (2004)
16. Nagappan, N., Ball, T.: Use of relative code churn measures to predict system defect density. In: The 27th International Conference on Software Engineering. ACM, St. Louis (2005)
17. Nagappan, N., Ball, T., Zeller, A.: Mining metrics to predict component failures. In: The 28th International Conference on Software Engineering. ACM, Shanghai (2006)
18. Nagappan, N., Ball, T., Zeller, A.: Mining metrics to predict component failures. In: Proceedings of the 28th International Conference on Software Engineering, pp. 452-461. ACM, New York (2006)
19. Olague, H.M., Etzkorn, L.H., Gholston, S., Quattlebaum, S.: Empirical Validation of Three Software Metrics Suites to Predict Fault-Proneness of Object-Oriented Classes Developed Using Highly Iterative or Agile Software Development Processes. IEEE Transactions on Software Engineering 33, 402-419 (2007)
20. Ostrand, T.J., Weyuker, E.J.: How to measure success of fault prediction models. In: Fourth International Workshop on Software Quality Assurance: in Conjunction with the 6th ESEC/FSE Joint Meeting. ACM, Dubrovnik (2007)
21. Ostrand, T.J., Weyuker, E.J., Bell, R.M.: Automating algorithms for the identification of fault-prone files. In: Proceedings of the 2007 International Symposium on Software Testing and Analysis. ACM, London (2007)
22. Pai, G.J., Dugan, J.B.: Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods. IEEE Transactions on Software Engineering 33, 675-686 (2007)
23. Ramler, R., Wolfmaier, K.: Issues and Effort in Integrating Data from Heterogeneous Software Repositories and Corporate Databases. In: 2nd International Symposium on Empirical Software Engineering and Measurement (ESEM 2008), Kaiserslautern, Germany (2008) (forthcoming)
24. Staples, M., Niazi, M.: Experiences using systematic review guidelines. Journal of Systems and Software 80, 1425-1437 (2007)
25. Sunghun, K., Thomas, Z., James, E., Whitehead, J., Andreas, Z.: Predicting Faults from Cached History. In: Proceedings of the 29th International Conference on Software Engineering. IEEE Computer Society, Los Alamitos (2007)
26. Wahyudin, D., Winkler, D., Schatten, A., Tjoa, A.M., Biffl, S.: Defect Prediction using Combined Product and Project Metrics A Case Study from the Open Source "Apache"MyFaces Project Family. In: 34th EUROMICRO Conference on Software Engineering and Advanced Applications SPPI Track, Parma, Italy (2008)
27. Weyuker, E.J., Ostrand, T.J., Bell, R.M.: Using Developer Information as a Factor for Fault Prediction. In: The Third International Workshop on Predictor Models in Software Engineering. IEEE Computer Society, Los Alamitos (2007)
28. Zimmermann, T., Premraj, R., Zeller, A.: Predicting Defects for Eclipse. In: International Workshop on Predictor Models in Software Engineering, PROMISE 2007: ICSE Workshops 2007, pp. 9-9 (2007)