When can we test less?

Proceedings - International Software Metrics Symposium

Volumn 2003-January, Issue , 2003, Pages 98-110

  Menzies, T ^a   Di Stefano, J ^a   Ammar, K ^a   McGill, K ^b   Callis, P ^b   Davis, J ^d   Chapman, R ^c  

^a West Virginia University   (United States)

^b NASA IV and V Facility   (United States)

^c Galaxy Global Corporation   (United States)

^d DN American ^*  (United States)

Author keywords

Software metrics; Software testing

Indexed keywords

DEFECTS;

DEFECT DETECTORS; MODEL TREES; SOFTWARE METRICS; TEST ENGINEERS;

SOFTWARE TESTING;

EID: 84943197013     PISSN: 15301435     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/METRIC.2003.1232459     Document Type: Conference Paper

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