Use of relative code churn measures to predict system defect density

Proceedings - International Conference on Software Engineering

Volumn 2005, Issue , 2005, Pages 284-292

  Nagappan, Nachiappan ^a,c   Ball, Thomas ^b  

^a North Carolina State University   (United States)

^b MICROSOFT RESEARCH   (United States)

^c THE MEASUREMENT GROUP   (United States)

Author keywords

Defect density; Fault proneness; Multiple regression; Principal component analysis; Relative code churn

Indexed keywords

FAULT PRONENESS; MULTIPLE REGRESSION; RELATIVE CODE CHURNS; SOFTWARE SYSTEMS;

COMPUTER SOFTWARE; COMPUTER VIRUSES; OPTIMIZATION; PRINCIPAL COMPONENT ANALYSIS; SECURITY OF DATA; SERVERS;

CODES (SYMBOLS);

EID: 33244463047     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSE.2005.1553571     Document Type: Conference Paper

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