Growth of shape-controlled Ca3NbGa3Si 2O14 and Sr3NbGa3Si 2O14 single crystals by micro-pulling-down method and their physical properties

Japanese Journal of Applied Physics

Volumn 50, Issue 9 PART 3, 2011, Pages

  Yokota, Yuui ^a   Sato, Masato ^a,b   Tota, Kazushige ^b   Futami, Yoshisuke ^c   Yanagida, Takayuki ^c   Onodera, Ko ^b   Yoshikawa, Akira ^a,c  

^a TOHOKU UNIVERSITY   (Japan)

^b TDK CORPORATION   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITIES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; GROWN CRYSTALS; GROWTH DIRECTIONS; MICRO-PULLING-DOWN; MICRO-PULLING-DOWN METHOD; PIEZOELECTRIC SINGLE CRYSTALS; POWDER X RAY DIFFRACTION; SHAPE-CONTROLLED; SINGLE PHASE;

CALCIUM; DIFFRACTIVE OPTICS; PHYSICAL PROPERTIES; SILICON; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

SINGLE CRYSTALS;

EID: 80053069134     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.09ND03     Document Type: Article

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