Carbon nanotube detection by scanning electron microscopy

Proceedings of the 11th IAPR Conference on Machine Vision Applications, MVA 2009

Volumn , Issue , 2009, Pages 370-373

  Wortmann, Tim ^a   Fatikow, Sergej ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESCRIPTORS; DISTRIBUTED CONTROL ARCHITECTURES; FULLY INTEGRATED; GEOMETRICAL OBJECTS; IMAGE NOISE; IMAGING CONDITIONS; LARGE SCALE EXPERIMENTS; OBJECT CLASSIFICATION; PRINCIPLE COMPONENT ANALYSIS; REAL-TIME ENVIRONMENT; SCANNING ELECTRON MICROSCOPIC;

CARBON NANOTUBES; DEBRIS; PRINCIPAL COMPONENT ANALYSIS; SCANNING ELECTRON MICROSCOPY;

COMPUTER VISION;

EID: 80053043678     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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