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Volumn 86, Issue 3, 2011, Pages 324-329

The use of I-V characteristics for the investigation of selected contacts for spray-deposited CdS:In thin films

Author keywords

Annealing; Electrical properties; Semiconductors; Thin films

Indexed keywords

CDS; CONTACT POTENTIAL; IV CHARACTERISTICS; ROOM TEMPERATURE; SPRAY-DEPOSITED;

EID: 80052966561     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2011.07.056     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.