ZnO nanocrystalline thin films: A correlation of microstructural, optoelectronic properties

Journal of Materials Science: Materials in Electronics

Volumn 21, Issue 4, 2010, Pages 355-359

  Patil, V B ^a   Pawar, S G ^a   Patil, S L ^a   Krupanidhi, S B ^b  

^a SOLAPUR UNIVERSITY   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DC CONDUCTIVITY; DC ELECTRICAL CONDUCTIVITY; ENERGY DISPERSIVE X-RAY; HEXAGONAL STRUCTURES; HEXAGONAL WURTZITE; MICRO-STRUCTURAL; MOLAR RATIO; NANOCRYSTALLINE GRAINS; NANOCRYSTALLINE THIN FILMS; OPTICAL STUDY; OPTOELECTRONIC PROPERTIES; RANDOMLY DISTRIBUTED; SEM MICROGRAPHS; SILICON SUBSTRATES; TEM IMAGES; VISIBLE RANGE; ZNO; ZNO FILMS; ZNO THIN FILM;

ELECTRIC CONDUCTIVITY; HOLOGRAPHIC INTERFEROMETRY; METALLIC FILMS; OPTICAL PROPERTIES; PLATINUM; SOL-GEL PROCESS; SPIN DYNAMICS; THIN FILMS; ZINC; ZINC COATINGS; ZINC OXIDE; ZINC SULFIDE;

OXIDE FILMS;

EID: 77950368568     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-009-9920-5     Document Type: Article

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