Characterization of single transition metal oxide nanorods by combining atomic force microscopy and polarized micro-Raman spectroscopy

Chemical Physics Letters

Volumn 514, Issue 1-3, 2011, Pages 128-133

  Najjar, Samar ^a   Talaga, David ^a   Coffinier, Yannick ^b   Szunerits, Sabine ^b   Boukherroub, Rabah ^b   Servant, Laurent ^a   Couzi, Michel ^a   Bonhommeau, Sébastien ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORUNDUM; CRYSTAL SYMMETRY; HEMATITE; II-VI SEMICONDUCTORS; NANORODS; SINGLE CRYSTALS; TRANSITION METALS; ZINC OXIDE; ZINC SULFIDE;

HEMATITE NANORODS; HIGH POTENTIAL; IN COMPOSITIONS; POLARIZED MICRO-RAMAN; SINGLE-CRYSTALLINE; STRUCTURAL CHARACTERIZATION; STRUCTURAL DISORDERS; ZINC OXIDE (ZNO);

TRANSITION METAL OXIDES;

EID: 80052956136     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2011.08.039     Document Type: Article

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