Electrical conduction behaviors and mechanical properties of Cu doping on B-site of (La0.8Ca0.2)(Cr0.9Co 0.1)O3-δ interconnect materials for SOFCs

International Journal of Hydrogen Energy

Volumn 36, Issue 20, 2011, Pages 13073-13082

  Fu, Yen Pei ^a   Wang, Hsin Chao ^a   Ouyang, Jie ^a  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

Author keywords

Electrical conductivity; Hydrogen induced cracking; Interconnect materials; Mechanical properties; Solid oxide fuel cells

Indexed keywords

CHARGE COMPENSATION MECHANISM; COMPENSATION MECHANISM; CU-DOPING; DEFECT CHEMISTRY; DEFECT FORMATION; ELECTRICAL COMPENSATION; ELECTRICAL CONDUCTION; ELECTRICAL CONDUCTIVITY; FORMING GAS; HIGHER TEMPERATURES; HYDROGEN INDUCED CRACKING; INTERCONNECT MATERIALS; IONIC COMPENSATION; LOW OXYGEN; MAXIMUM VALUES; OXYGEN ACTIVITY; P-TYPE; REDUCING ATMOSPHERE; SOLID OXIDE;

CALCIUM; CERAMIC MATERIALS; CHROMIUM; DEFECTS; ELECTRIC CONDUCTIVITY; FRACTURE; FRACTURE TOUGHNESS; HOLE CONCENTRATION; HYDROGEN; MATERIALS PROPERTIES; MECHANISMS; OXYGEN; OXYGEN VACANCIES; SOLID OXIDE FUEL CELLS (SOFC);

MECHANICAL PROPERTIES;

EID: 80052925425     PISSN: 03603199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijhydene.2011.07.038     Document Type: Article

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