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Volumn 519, Issue 23, 2011, Pages 8199-8202
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Defect induced room temperature ferromagnetism in well-aligned ZnO nanorods grown on Si (100) substrate
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Author keywords
Magnetization; Nanorods; PL; XRD; ZnO
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Indexed keywords
AS-GROWN;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
GREEN LIGHT EMISSION;
HIGH QUALITY;
MAGNETIZATION MEASUREMENTS;
MICROWAVE ASSISTED;
NEAR BAND EDGE EMISSIONS;
PL;
PL SPECTRA;
ROOM TEMPERATURE;
ROOM TEMPERATURE FERROMAGNETISM;
SI (100) SUBSTRATE;
SILICON SUBSTRATES;
SINGLE PHASE;
SINGLE-CRYSTALLINE;
SOLUTION METHODS;
SURFACE OXYGEN VACANCIES;
WELL-ALIGNED;
WURTZITE STRUCTURE;
XRD;
ZNO;
ZNO NANOROD;
ZNO NANOROD ARRAYS;
ASPECT RATIO;
DEFECTS;
FERROMAGNETISM;
FIELD EMISSION MICROSCOPES;
LIGHT;
LIGHT EMISSION;
MAGNETIZATION;
OXYGEN VACANCIES;
SCANNING ELECTRON MICROSCOPY;
SURFACE DEFECTS;
X RAY DIFFRACTION;
ZINC OXIDE;
ZINC SULFIDE;
NANORODS;
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EID: 80052764831
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.03.062 Document Type: Conference Paper |
Times cited : (39)
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References (23)
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