Angular resolved scattering measurements of nano-textured substrates in a broad wavelength range

Measurement Science and Technology

Volumn 22, Issue 10, 2011, Pages

  Jager K ^a   Isabella, O ^a   Van Swaaij, R A C M M ^a   Zeman, M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

angular resolved scattering; spectrometry; surface textured thin films

Indexed keywords

ANGULAR DISTRIBUTION; INFRARED DEVICES; SOLAR CELLS; SPECTROMETRY; SURFACE SCATTERING; THIN FILM SOLAR CELLS;

ANGULAR INTENSITY DISTRIBUTION; NEAR INFRARED; NEAR ULTRAVIOLET; SCATTERING MEASUREMENTS; TEXTURED SUBSTRATES; WAVELENGTH RANGES;

THIN FILMS;

EID: 80052741155     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/10/105601     Document Type: Article

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