Cobalt-60, proton and electron irradiation of a radiation-hardened active pixel sensor

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2009, Pages 535-538

  Hervé, Dominique ^a   Beaumel, Matthieu ^a   Van Aken, Dirk ^b  

^a AIRBUS GROUP INNOVATIONS   (Germany)

^b Cypress Semiconductors BVBA   (Belgium)

Author keywords

active pixel sensor; cobalt 60; displacement damage; electrons; hot pixels; ionizing dose; protons; star tracker

Indexed keywords

ACTIVE PIXEL SENSOR; COBALT-60; DISPLACEMENT DAMAGES; HOT PIXELS; IONIZING DOSE;

CHARGE COUPLED DEVICES; COBALT; ELECTRON IRRADIATION; ELECTRONS; ENERGY DISSIPATION; HARDENING; IONIZING RADIATION; PROTONS; RADIATION EFFECTS; SENSORS; STAR TRACKERS;

PIXELS;

EID: 80052693075     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2009.5994709     Document Type: Conference Paper

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