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Volumn , Issue , 2011, Pages 288-289

Device aging-based physically unclonable functions

Author keywords

Device aging; hardware security; PPUF; PUF; self trust

Indexed keywords

DEVICE AGING; HARDWARE SECURITY; PPUF; PUF; SELF-TRUST;

EID: 80052678346     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (35)

References (9)
  • 1
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    • Silicon physical random functions
    • B. Gassend et al., "Silicon physical random functions,"ACM CCS, pp. 148-160, 2002.
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    • Gassend, B.1
  • 2
    • 70350469042 scopus 로고    scopus 로고
    • Hardware-based public-key cryptography with public physically Unclonable Functions
    • N. Beckmann and M. Potkonjak, "Hardware-based public-key cryptography with public physically Unclonable Functions," Info. Hiding, pp. 206-220, 2009.
    • (2009) Info. Hiding , pp. 206-220
    • Beckmann, N.1    Potkonjak, M.2
  • 3
    • 79951864434 scopus 로고    scopus 로고
    • Trusted sensors and remote sensing
    • M. Potkonjak et al., "Trusted sensors and remote sensing", IEEE Sensors, pp. 1104-1107, 2010.
    • (2010) IEEE Sensors , pp. 1104-1107
    • Potkonjak, M.1
  • 4
    • 80052657960 scopus 로고    scopus 로고
    • Differential public physically unclonable functions: Architecture and applications
    • M. Potkonjak et al., "Differential public physically unclonable functions: architecture and applications,"ACM/IEEE DAC, 2011.
    • (2011) ACM/IEEE DAC
    • Potkonjak, M.1
  • 5
    • 84936849803 scopus 로고    scopus 로고
    • Testing techniques for hardware security
    • M. Majzoobi et al., "Testing techniques for hardware security," IEEE ITC pp. 1-10, 2008.
    • (2008) IEEE ITC , pp. 1-10
    • Majzoobi, M.1
  • 6
    • 78649989155 scopus 로고    scopus 로고
    • Modeling attacks on physical unclonable functions
    • U. Ruhrmair et al., "Modeling attacks on physical unclonable functions," ACM CCS, pp. 237-249, 2010
    • (2010) ACM CCS , pp. 237-249
    • Ruhrmair, U.1
  • 7
    • 77956221000 scopus 로고    scopus 로고
    • Gate-level characterization: Foundations and hardware security applications
    • S. Wei et al., "Gate-level characterization: foundations and hardware security applications," ACM/IEEE DAC, pp. 222-227, 2010.
    • (2010) ACM/IEEE DAC , pp. 222-227
    • Wei, S.1
  • 8
    • 80052656793 scopus 로고    scopus 로고
    • Malicious Circuitry Detection Using Thermal Conditioning
    • S. Wei et al., "Malicious Circuitry Detection Using Thermal Conditioning," IEEE TIFS, 2011.
    • (2011) IEEE TIFS
    • Wei, S.1
  • 9
    • 77951878300 scopus 로고    scopus 로고
    • 11PBTI/NBTI-related variability in TB-SOI and DG MOSFETs
    • B. Cheng et al., 11PBTI/NBTI-related variability in TB-SOI and DG MOSFETs," IEEE Electron Devices Letters, vol. 31, no. 5, pp. 408-410, 2010.
    • (2010) IEEE Electron Devices Letters , vol.31 , Issue.5 , pp. 408-410
    • Cheng, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.