Characterization of the ion beam focusing in a mass spectrometer using an IonCCD™ detector

Journal of the American Society for Mass Spectrometry

Volumn 22, Issue 8, 2011, Pages 1388-1394

  Johnson, Grant E ^a   Hadjar, Omar ^b   Laskin, Julia ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b CMS Field Products   (United States)

Author keywords

Ion focusing; Ion optics; IonCCD; Pixel based detector; Position sensitive detection; Soft landing

Indexed keywords

ION FOCUSING; ION OPTICS; IONCCD; PIXEL-BASED DETECTOR; POSITION-SENSITIVE DETECTION; SOFT LANDING;

BEAM PLASMA INTERACTIONS; DETECTORS; ELECTROSTATIC LENSES; FOCUSING; ION BEAMS; ION BOMBARDMENT; LANDING; MASS SPECTROMETERS; MASS SPECTROMETRY; PIXELS;

IONS;

ARTICLE; CAMERA; COMPUTER PROGRAM; COMPUTER SIMULATION; EQUIPMENT DESIGN; ERROR; MASS SPECTROMETER; OPTICS; QUADRUPOLE MASS SPECTROMETRY; RADIOFREQUENCY; SEMICONDUCTOR;

EID: 80052675827     PISSN: 10440305     EISSN: 18791123     Source Type: Journal    
DOI: 10.1007/s13361-011-0154-4     Document Type: Article

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