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Journal of the American Society for Mass Spectrometry

Volumn 17, Issue 3, 2006, Pages 335-340

Improving the quality of the ion beam exiting a quadrupole ion guide

(2) Berkout, Vadym D a Doroshenko, Vladimir M a

a MassTech Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FREQUENCIES; IONIC STRENGTH; MASS SPECTROMETRY;

ION BEAM DIVERGENCE; MASS ANALYZER; TIME-OF-FLIGHT (TOF);

ION BEAMS;

ION;

ARTICLE; COMPUTER SIMULATION; EXPERIMENTATION; ION TRANSPORT; TIME OF FLIGHT MASS SPECTROMETRY;

COMPUTER-AIDED DESIGN; ELECTROMAGNETICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IONS; RADIO WAVES; SPECTROMETRY, MASS, ELECTROSPRAY IONIZATION;

EID: 33344464258 PISSN: 10440305 EISSN: None Source Type: Journal
DOI: 10.1016/j.jasms.2005.12.002 Document Type: Article

Times cited : (9)

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