Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2011, Pages 28-29

  Degraeve, R ^a,b   Goux, L ^a,b   Roussel, Ph ^a,b   Wouters, D J ^a,b   Kittl, J A ^a,b   Altimime, L ^a,b   Jurczak, M ^a,b   Groeseneken, G ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION MODELS; CONDUCTIVE FILAMENTS; METALLIC FILAMENTS; STOCHASTIC COMPONENT;

STOCHASTIC SYSTEMS;

STOCHASTIC MODELS;

EID: 80052657103     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Degraeve R. et al., IEDM Tech. Dig., 2010.
2. Raghavan N., APL 96, 142901, 2010.
3. Ielmini D. et al., APL 96, 053503, 2010.
4. Li X et al., APL 94, 132904, 2009.