Deposition of nanocrystalline CuS thin film from a single precursor: Structural, optical and electrical properties

Materials Chemistry and Physics

Volumn 130, Issue 1-2, 2011, Pages 392-397

  Maji, Swarup Kumar ^a   Mukherjee, Nillohit ^a   Dutta, Amit Kumar ^a   Srivastava, Divesh N ^b   Paul, Parimal ^b   Karmakar, Basudeb ^c   Mondal, Anup ^a   Adhikary, Bibhutosh ^a  

^a INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

^b CSIR CENTRAL SALT AND MARINE CHEMICALS RESEARCH INSTITUTE   (India)

^c CSIR CENTRAL GLASS AND CERAMIC RESEARCH INSTITUTE   (India)

Author keywords

Electrical properties; MOD technique; Nanoparticles; Optical properties; Semiconductor; Single precursor

Indexed keywords

AVERAGE PARTICLE SIZE; BAND GAP ENERGY; BLUE SHIFT; COVELLITE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HALL MEASUREMENTS; METAL ORGANIC DEPOSITION; MOD TECHNIQUES; NANOCRYSTALLINES; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL MEASUREMENT; P-TYPE CONDUCTION; RAMAN SPECTROSCOPIC; SEMICONDUCTOR; SINGLE PRECURSORS; UV-VIS ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CARRIER CONCENTRATION; COPPER; DEPOSITION; FIELD EMISSION MICROSCOPES; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; ORGANOMETALLICS; PHOTOLUMINESCENCE SPECTROSCOPY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 80052582852     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2011.06.057     Document Type: Article

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