Preparation and characteristics of porous CuS microspheres consisted of polycrystalline nanoslices

Powder Technology

Volumn 199, Issue 2, 2010, Pages 139-143

  Xu, Shuang ^a   Wang, Qun ^b   Cheng, Ji hang ^a   Meng, Qing hui ^a   Jiao, Yang ^a  

^a AVIATION UNIVERSITY OF AIR FORCE   (China)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Copper sulfide; Gas sensitivity; Polycrystalline

Indexed keywords

COPPER SULFIDES; ELECTRICAL CONDUCTIVITY; FACILE METHOD; GAS ATMOSPHERE; GAS SENSITIVITY; INTERGROWTH; LASER RAMAN; POLYCRYSTALLINE; POROUS MICROSPHERES; SELECTED AREA ELECTRONIC DIFFRACTION; SELF-ASSEMBLE; SEM; TEM;

AMMONIA; DIFFRACTION; ELECTRIC CONDUCTIVITY; MICROSPHERES; SCANNING ELECTRON MICROSCOPY; ULTRAVIOLET LASERS; X RAY DIFFRACTION;

TRANSMISSION ELECTRON MICROSCOPY;

AMMONIA; COPPER DERIVATIVE; COPPER SULFIDE; MICROSPHERE; UNCLASSIFIED DRUG;

AIR; ARTICLE; ATMOSPHERE; CHEMICAL ANALYSIS; CONTROLLED STUDY; CRYSTAL STRUCTURE; DIFFRACTION; DIFFUSE REFLECTANCE SPECTROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; NANOFABRICATION; PHYSICAL CHEMISTRY; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SELECTIVE AREA ELECTRONIC DIFFRACTION; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 76749114389     PISSN: 00325910     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.powtec.2009.12.013     Document Type: Article

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