Numerical impedance analysis for organic semiconductors with exponential distribution of localized states

Applied Physics Letters

Volumn 99, Issue 9, 2011, Pages

  Knapp, Evelyne ^a   Ruhstaller, Beat ^a,b  

^a ZURICH UNIVERSITY OF APPLIED SCIENCES   (Switzerland)

^b FLUXIM AG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC TEMPERATURE; EXPONENTIAL DISTRIBUTIONS; FREQUENCY-DEPENDENT CAPACITANCE; IMPEDANCE ANALYSIS; IMPEDANCE SPECTROSCOPY; LOCALIZED STATE; LOW FREQUENCY; ORGANIC SEMICONDUCTOR DEVICES; PHYSICAL MODEL; SIMPLIFIED METHOD; TRAP DENSITY; TRAPPING PARAMETER;

CAPACITANCE; SEMICONDUCTOR DEVICES;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 80052543993     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3633109     Document Type: Article

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