90nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques

2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011

Volumn , Issue , 2011, Pages

  Parsons, Aaron D ^a   Chapman, Richard T ^a   Mills, Benjamin ^a   Butcher, Thomas J ^a   Frey, Jeremy G ^a   Brocklesby, William S ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT ILLUMINATION; DIFFRACTION LIMITS; DIFFRACTIVE IMAGING; FAR FIELD; FAR FIELD DIFFRACTION PATTERN; FOURIER; MATERIAL ABSORPTION; NM RESOLUTION; OPTICAL CONTRAST; PHASE RETRIEVAL; SHORT WAVELENGTHS; SYNCHROTRON SOURCE;

DIFFRACTION; ELECTRIC FIELDS; ELECTRON OPTICS; OPTICS; QUANTUM ELECTRONICS;

POSITION CONTROL;

EID: 80052294073     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEOE.2011.5942771     Document Type: Conference Paper

References (4)

1. Y. Takahashi et al, "High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam" Phys. Rev. B. 80, 054103 (2009).
2. R. L. Sandberg et al, "High numerical aperture tabletop soft x-ray diffraction microscopy with 70 nm resolution" PNAS. 105, 24-27 (2008).
3. S. Teichmann et al, "Experimental aspects of multiharmonic-order coherent diffractive imaging" J. Appl. Phys. 108, 023106 (2010).
4. S. Marchesini et al, "X-ray image reconstruction from a diffraction pattern alone" Phys. Rev. B. 68, 140101 (2003).