SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 672-675

Fabrication and characterization of APT specimens from high dose heavy ion irradiated materials

(2) Miller, M K a Zhang, Y a

a OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

Atom probe tomography; Focused ion beam milling; Ion irradiation; Radiation damage

Indexed keywords

ATOMS; CHARACTERIZATION; FERRITIC STEEL; FOCUSED ION BEAMS; HEAVY IONS; ION BOMBARDMENT; IRRADIATION; MILLING (MACHINING); PROBES; RADIATION DAMAGE;

ADVANCED ENERGY SYSTEMS; ATOM PROBE TOMOGRAPHY; DISPLACEMENTS PER ATOMS; ELEVATED TEMPERATURE; FABRICATION AND CHARACTERIZATIONS; FOCUSED ION BEAM MILLING; IRRADIATED MATERIALS; RADIATION TOLERANT;

ION BEAMS;

HEAVY ION; OXYGEN; STEEL; TITANIUM; YTTRIUM;

ANALYTIC METHOD; ARTICLE; ATOM PROBE TOMOGRAPHY; IRRADIATION; RADIATION DOSE; TEMPERATURE; TOMOGRAPHY;

EID: 80052273700 PISSN: 03043991 EISSN: 18792723 Source Type: Journal
DOI: 10.1016/j.ultramic.2010.12.036 Document Type: Article

Times cited : (19)

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