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Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7553-7555

Investigation of Cu(In,Ga)Se2/In2S3 diffuse interface by Raman scattering

(4) Laurencic, C a Arzel, L a F couzinie Devy a Barreau, N a

a UNIVERSITÉ DE NANTES (France)

Author keywords

CIGSe; Raman

Indexed keywords

BINARY ALLOYS; DEPOSITION; INDIUM SULFIDE; IODINE COMPOUNDS; RAMAN SCATTERING; SURFACE DEFECTS;

CIGSE; COMPOSITION PROFILE; DEPOSITION TEMPERATURES; DIFFUSE INTERFACE; ORDERED DEFECT COMPOUNDS; RAMAN; SCATTERING TECHNIQUES; SUBSTRATE TEMPERATURE;

SULFUR COMPOUNDS;

EID: 80052165805 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.12.089 Document Type: Conference Paper

Times cited : (15)

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