Critical temperature enhancement by biaxial compressive strain in FeSe 0.5 Te0.5 thin films

Journal of Superconductivity and Novel Magnetism

Volumn 24, Issue 1-2, 2011, Pages 35-41

  Bellingeri, E ^a   Pallecchi, I ^a   Buzio, R ^a   Gerbi, A ^a   Marre D ^a,b   Cimberle, M R ^b   Tropeano, M ^a,b   Putti, M ^a,b   Palenzona, A ^a,c   Kaciulis, S ^d   Ferdeghini, C ^a  

^a CNR SPIN   (Italy)

^b IMEM CNR   (Italy)

^c UNIVERSITY OF GENOA   (Italy)

^d CNR   (Italy)

Author keywords

Epitaxial growth; Fe(Se,Te); Strain; Thin films

Indexed keywords

BOND LENGTH; EPITAXIAL GROWTH; FILM THICKNESS; IRON COMPOUNDS; LASER ABLATION; SELENIUM COMPOUNDS; STRAIN; TELLURIUM COMPOUNDS; TEMPERATURE;

BIAXIAL COMPRESSIVE STRAIN; BULK VALUE; COMPRESSIVE STRAIN; CRITICAL TEMPERATURES; DIFFERENT SUBSTRATES; HIGH PURITY;

THIN FILMS;

EID: 80052148033     PISSN: 15571939     EISSN: 15571947     Source Type: Journal    
DOI: 10.1007/s10948-010-0896-4     Document Type: Article

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