Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector

Journal of Synchrotron Radiation

Volumn 18, Issue 5, 2011, Pages 747-752

  Tamenori, Y ^a   Morita, M ^b   Nakamura, T ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

map approach; partial fluorescence yield; silicon drift detector; soft X rays; XANES

Indexed keywords

MAP APPROACH; PARTIAL FLUORESCENCE YIELD; SILICON DRIFT DETECTOR; SOFT X-RAY; XANES;

ABSORPTION; ATOMIC SPECTROSCOPY; DETECTORS; MANGANESE; MANGANESE OXIDE; PHOSPHORUS; TWO DIMENSIONAL; X RAYS;

FLUORESCENCE;

EID: 80052147955     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049511027531     Document Type: Article

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