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Volumn 78, Issue 4, 2008, Pages

Noise from metallic surfaces: Effects of charge diffusion

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; METALLIC COMPOUNDS; SEMICONDUCTOR DOPING; SURFACE MEASUREMENT;

EID: 55749087525     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.78.042902     Document Type: Article
Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.