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Optics Letters

Volumn 36, Issue 16, 2011, Pages 3100-3102

Tight focusing with a binary microaxicon

(4) Kotlyar, V V a Stafeev, S S b O'Faolain, L c Soifer, V A a

a RUSSIAN ACADEMY OF SCIENCES (Russian Federation)

b SAMARA NATIONAL RESEARCH UNIVERSITY (Russian Federation)

c UNIVERSITY OF ST ANDREWS (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATED VALUES; DEPTH OF FOCUS; FOCAL SPOT; FOCUS INTENSITY; ILLUMINATION BEAMS; LINEARLY POLARIZED LASERS; NEAR FIELD SCANNING MICROSCOPE; RMS DEVIATIONS; TIGHT FOCUSING;

FOCUSING;

EID: 80051757991 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.36.003100 Document Type: Article

Times cited : (33)

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