Interferometric characterization of a microaxicon with a single fringe pattern

Journal of Optics

Volumn 13, Issue 3, 2011, Pages

  Kuang, Dengfeng ^a   Han, Meirui ^a   Gao, Hui ^a   Du, Zhongxun ^a   Fang, Zhiliang ^a  

^a NANKAI UNIVERSITY   (China)

Author keywords

fringe pattern; interferometry; microaxicon; phase retrieval

Indexed keywords

ATOMIC FORCE MICROSCOPY; INDUCTIVELY COUPLED PLASMA;

DIRECT LASER WRITING; FIELD PROFILE; FRINGE PATTERN; INTERFERENCE FRINGE PATTERN; MICROAXICON; PHASE RETRIEVAL; SIMPLE APPROACH; WORKING DISTANCES;

INTERFEROMETRY;

EID: 79952667358     PISSN: 20408978     EISSN: 20408986     Source Type: Journal    
DOI: 10.1088/2040-8978/13/3/035501     Document Type: Article

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