Bayesian process optimization using failure amplification method

Applied Stochastic Models in Business and Industry

Volumn 27, Issue 4, 2011, Pages 402-409

  Yu, I Tang ^a   Joseph, V Roshan ^b  

^a TUNGHAI UNIVERSITY   (Taiwan)

^b Georgia Institute of Technology   (United States)

Author keywords

binary data; Gaussian process; geostatistical models; kriging

Indexed keywords

BAYESIAN APPROACHES; BINARY DATA; GAUSSIAN PROCESS MODELS; GAUSSIAN PROCESSES; GEOSTATISTICAL MODELS; KRIGING; LATENT VARIABLE; MODEL FITTING; PRINTED CIRCUIT BOARD MANUFACTURING;

AMPLIFICATION; BAYESIAN NETWORKS; DESIGN OF EXPERIMENTS; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT DESIGN;

OPTIMIZATION;

EID: 80051713651     PISSN: 15241904     EISSN: 15264025     Source Type: Journal    
DOI: 10.1002/asmb.846     Document Type: Article

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