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Volumn 40, Issue 2, 2008, Pages 128-139

Modeling and analysis strategies for failure amplification method

Author keywords

Design of experiments; Generalized linear models; Model selection; Process capability; Robust parameter design

Indexed keywords

AMPLIFICATION; COMPUTATIONAL METHODS; DESIGN OF EXPERIMENTS; OPTIMIZATION; PARAMETER ESTIMATION; PRINTED CIRCUIT BOARDS; PROBABILITY;

EID: 41549153732     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2008.11917720     Document Type: Article
Times cited : (4)

References (10)
  • 1
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    • Generalized Linear Models for Quality-Improvement Experiments
    • HAMADA, M and NELDER, J. A. (1997). "Generalized Linear Models for Quality-Improvement Experiments". Journal of Quality Technology 29, pp. 292-304.
    • (1997) Journal of Quality Technology , vol.29 , pp. 292-304
    • HAMADA, M.1    NELDER, J.A.2
  • 2
    • 0001122511 scopus 로고
    • Analysis of Designed Experiment with Complex Aliasing
    • HAMADA, M and WU, C. F. J. (1992). "Analysis of Designed Experiment with Complex Aliasing". Journal of Quality Technology 24, pp. 103-137.
    • (1992) Journal of Quality Technology , vol.24 , pp. 103-137
    • HAMADA, M.1    WU, C.F.J.2
  • 3
    • 0035438523 scopus 로고    scopus 로고
    • Prediction of Yield in a Multi-Product Batch Production Environment
    • JOSEPH, V. R. and ADYA, H. (2001). "Prediction of Yield in a Multi-Product Batch Production Environment". Quality Engineering 14, pp. 153-159.
    • (2001) Quality Engineering , vol.14 , pp. 153-159
    • JOSEPH, V.R.1    ADYA, H.2
  • 4
    • 1542471463 scopus 로고    scopus 로고
    • Failure Amplification Method: An Information Maximization Approach to Categorical Response Optimization (with Discussion)
    • JOSEPH, V. R. and WU, C. F. J. (2004). "Failure Amplification Method: An Information Maximization Approach to Categorical Response Optimization (with Discussion)". Technometrics 46, pp. 1-31.
    • (2004) Technometrics , vol.46 , pp. 1-31
    • JOSEPH, V.R.1    WU, C.F.J.2
  • 5
    • 0033281370 scopus 로고    scopus 로고
    • Improving the Yield of Printed Circuit Boards Using Design of Experiments
    • MARUTHI, B. N., and JOSEPH, V. R. (1999). "Improving the Yield of Printed Circuit Boards Using Design of Experiments". Quality Engineering 12, pp. 259-265.
    • (1999) Quality Engineering , vol.12 , pp. 259-265
    • MARUTHI, B.N.1    JOSEPH, V.R.2
  • 6
    • 41549092470 scopus 로고    scopus 로고
    • MARUTHI, B. N.; SOMASHEKAR, H. S.; SHARMA, R. K.; KUMAR, K.; and JOSEPH, V. R. (1998). Improving the Process of Outer Layer Image Transfer in PCB Manufacturing. Conference Proceedings of the 8th National Convention of NIQR, Bangalore, India, pp. 1A.1-1A.8.
    • MARUTHI, B. N.; SOMASHEKAR, H. S.; SHARMA, R. K.; KUMAR, K.; and JOSEPH, V. R. (1998). "Improving the Process of Outer Layer Image Transfer in PCB Manufacturing". Conference Proceedings of the 8th National Convention of NIQR, Bangalore, India, pp. 1A.1-1A.8.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.