Improving the yield of printed circuit boards using design of experiments

Quality Engineering

Volumn 12, Issue 2, 1999, Pages 259-265

  Maruthi, B N ^a,c,d   Roshan Joseph, V ^b  

^a Indal Electronics Ltd   (India)

^b INDIAN STATISTICAL INSTITUTE   (India)

^c BANGALORE UNIVERSITY   (India)

^d Indal Electronics   (India)

Author keywords

Inner layer; Linewidth; Opens; PCB; Shorts; Signal to noise ratio; Spacing

Indexed keywords

OPTIMIZATION; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT DESIGN; PRINTED CIRCUIT MANUFACTURE; PROCESS CONTROL; PROCESS ENGINEERING; SIGNAL TO NOISE RATIO; SPECIFICATIONS; VALUE ENGINEERING;

DESIGN OF EXPERIMENTS; INNER LAYER FABRICATION;

QUALITY CONTROL;

EID: 0033281370     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1080/08982119908962583     Document Type: Article

References (3)

1. Coombs, C. F., Jr., Printed Circuits Handbook, 4th ed., McGraw-Hill, New York, 1996.
2. Phadke, M. S., Quality Engineering Using Robust Design, Prentice-Hall, Englewood Cliffs, NJ, 1989.
3. Taguchi, G., System of Experimental Design, UNIPUB, New York/American Supplier Institute, Dearborn, MI, 1988, Vols. 1 and 2.