Infrared spectroscopic growth studies of an organic semiconductor

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 8, 2011, Pages 1873-1878

  Glaser, Tobias ^a   Binder, Martin ^a   Lennartz, Christian ^b   Schildknecht, Christian ^b   Pucci, Annemarie ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b BASF SE   (Germany)

Author keywords

infrared spectroscopy; organic semiconductor; vibrational spectra

Indexed keywords

IN-SITU MONITORING; INFRARED SPECTRAL; INFRARED SPECTROSCOPIC; ISOTROPIC LAYERS; MOLECULAR PROPERTIES; MUTUAL INTERACTION; NO PHASE; ORGANIC FILMS; ORGANIC SEMICONDUCTOR; PHOSPHORESCENT EMITTERS; POLARIZATION CONDITIONS; SPECTRAL MODIFICATIONS;

ELECTRONIC PROPERTIES; INFRARED SPECTROSCOPY; LIGHT EMISSION; MOLECULAR ELECTRONICS; ORGANIC LIGHT EMITTING DIODES (OLED); PHASE TRANSITIONS; SEMICONDUCTOR DIODES; SEMICONDUCTOR GROWTH; THERMAL EVAPORATION; VACUUM EVAPORATION; VAN DER WAALS FORCES; VIBRATIONAL SPECTRA;

FILM GROWTH;

EID: 80051697690     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026766     Document Type: Article

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