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Volumn 49, Issue 11, 2011, Pages 1274-1280

Accuracy improvement of laser line scanning for feature measurements on CMM

Author keywords

CMM; Dimensional quality control; Form deviation; Laser line scanning; Touch trigger probing

Indexed keywords

CMM; DIMENSIONAL QUALITY; FORM DEVIATION; LASER LINE SCANNING; TOUCH-TRIGGER PROBING;

EID: 79961168503     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2011.06.009     Document Type: Article
Times cited : (65)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.