Top-Down approach to fiber-top cantilevers

Optics Letters

Volumn 36, Issue 15, 2011, Pages 2898-2900

  Gavan, Khashayar Babaei ^a   Rector, Jan H ^a   Heeck, Kier ^a   Chavan, Dhwajal ^a   Gruca, Grzegorz ^a   Oosterkamp, Tjerk H ^b   Iannuzzi, Davide ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BIOCHEMICAL SUBSTANCE; HIGHLY SENSITIVE; LOW MASS; MASS SENSITIVITY; MECHANICAL QUALITY FACTORS; MICROMACHINING TECHNIQUES; PROOF OF CONCEPT; REMOTE DETECTION; RESONANCE FREQUENCIES; SERIES PRODUCTION; TOP-DOWN APPROACH; TOPDOWN;

PHOTOLITHOGRAPHY; RESONANCE;

NANOCANTILEVERS;

GLASS FIBER; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; ELECTRON MICROSCOPY; METHODOLOGY; MICROTECHNOLOGY;

MICROSCOPY, ELECTRON; MICROTECHNOLOGY; OPTICAL FIBERS; SILICON DIOXIDE;

EID: 79961152988     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.002898     Document Type: Article

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