Disorder driven optical processes in nanocrystalline ZnO

Journal of Luminescence

Volumn 132, Issue 1, 2012, Pages 6-11

  Chattopadhyay, S ^a,c,e   Neogi, S K ^a   Pandit, P ^a   Dutta, S ^a   Rakshit, Tamita ^b   Jana, D ^a   Sarkar, A ^d   Ray, S K ^b  

^a UNIVERSITY OF CALCUTTA   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

^c TAKI GOVERNMENT COLLEGE   (India)

^d BANGABASI COLLEGE   (India)

^e CALCUTTA INSTITUTE OF ENGINEERING AND MANAGEMENT   (India)

Author keywords

Defects; Photoluminescence; ZnO

Indexed keywords

ABSORPTION BAND; AVERAGE GRAIN SIZE; BAND EDGE; BAND TAIL; BAND-EDGE EMISSION INTENSITY; BAND-EDGE EMISSIONS; DIVACANCIES; EDGE EMISSIONS; EXPONENTIAL RELATION; GRAIN MORPHOLOGIES; GRAIN SIZE; INITIAL STAGES; MILLING TIME; NANOCRYSTALLINE ZNO; OPTICAL PROCESS; PL INTENSITY; RED SHIFT; ROOM TEMPERATURE; ROOM TEMPERATURE PHOTOLUMINESCENCE SPECTRA; SCANNING ELECTRON MICROGRAPHS; SUB-BANDS; SYSTEMATIC STUDY; ZNO; ZNO POWDER;

ABSORPTION; CHEMICAL MODIFICATION; GRAIN SIZE AND SHAPE; LASER RADIATION; LIGHT ABSORPTION; MILLING (MACHINING); PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; ZINC OXIDE;

OPTICAL PROPERTIES;

EID: 79961116741     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2011.06.060     Document Type: Article

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