Loycal atomic and electronic structures and ferroelectric properties of PbZr0.52Ti0.48O3: An x-ray absorption study

Applied Physics Letters

Volumn 99, Issue 4, 2011, Pages

  Ray, S C ^a,b   Hsueh, H C ^a   Wu, C H ^a   Pao, C W ^a   Asokan, K ^a,g   Liu, M T ^a   Tsai, H M ^a   Chuang, C H ^a   Pong, W F ^a   Chiou, J W ^c   Tsai, M H ^d   Lee, J M ^e   Jang, L Y ^f   Chen, J M ^f   Lee, J F ^f  

^a TAMKANG UNIVERSITY   (Taiwan)

^b UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^c NATIONAL UNIVERSITY OF KAOHSIUNG   (Taiwan)

^d NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^e NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^f NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^g INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FIELD; DOUBLE-WELL POTENTIAL; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FERROELECTRIC PROPERTY; INCIDENT ANGLES; PZT; PZT FILM;

ABSORPTION; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; FERROELECTRIC FILMS; POLARIZATION; X RAY ABSORPTION; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 79961064457     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3607475     Document Type: Article

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