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Volumn 1218, Issue 34, 2011, Pages 5819-5828
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Relationship between selectivity and average resolution in comprehensive two-dimensional separations with spectroscopic detection
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Author keywords
Comprehensive two dimensional separation; Diode array detection; Multivariate selectivity; Peak broadening factor; Resolution; Statistical overlap theory
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Indexed keywords
COMPREHENSIVE TWO-DIMENSIONAL SEPARATION;
DIODE ARRAY DETECTION;
MULTIVARIATE SELECTIVITY;
PEAK-BROADENING FACTOR;
STATISTICAL-OVERLAP THEORY;
TWO DIMENSIONAL;
ACCURACY;
ARTICLE;
DIODE;
DIODE ARRAY DETECTION;
FACTORIAL ANALYSIS;
LIQUID CHROMATOGRAPHY;
MATHEMATICAL COMPUTING;
MULTIVARIATE ANALYSIS;
MULTIVARIATE SELECTIVITY;
PARALLEL FACTOR ANALYSIS;
PRIORITY JOURNAL;
PROCESS OPTIMIZATION;
SAMPLING;
SIMULATION;
STATISTICAL CONCEPTS;
STATISTICAL OVERLAP THEORY;
ULTRAVIOLET SPECTROSCOPY;
ALGORITHMS;
CHROMATOGRAPHY, LIQUID;
MODELS, THEORETICAL;
SPECTRUM ANALYSIS;
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EID: 79961014164
PISSN: 00219673
EISSN: 18733778
Source Type: Journal
DOI: 10.1016/j.chroma.2011.06.086 Document Type: Article |
Times cited : (10)
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References (52)
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