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Volumn 1218, Issue 34, 2011, Pages 5819-5828

Relationship between selectivity and average resolution in comprehensive two-dimensional separations with spectroscopic detection

Author keywords

Comprehensive two dimensional separation; Diode array detection; Multivariate selectivity; Peak broadening factor; Resolution; Statistical overlap theory

Indexed keywords

COMPREHENSIVE TWO-DIMENSIONAL SEPARATION; DIODE ARRAY DETECTION; MULTIVARIATE SELECTIVITY; PEAK-BROADENING FACTOR; STATISTICAL-OVERLAP THEORY;

EID: 79961014164     PISSN: 00219673     EISSN: 18733778     Source Type: Journal    
DOI: 10.1016/j.chroma.2011.06.086     Document Type: Article
Times cited : (10)

References (52)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.