Dependence on saturation of average minimum resolution in two-dimensional statistical-overlap theory: Peak overlap in saturated two-dimensional separations

Journal of Chromatography A

Volumn 1126, Issue 1-2, 2006, Pages 244-256

  Liu, Siyuan ^a   Davis, Joe M ^a  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

Probability of peak overlap; Statistical overlap theory; Two dimensional separations

Indexed keywords

COMPUTATION THEORY; COMPUTER SIMULATION; LEAST SQUARES APPROXIMATIONS; NUMBER THEORY; REGRESSION ANALYSIS; SATURATION (MATERIALS COMPOSITION); SEPARATION;

EQUIVALENT CLUSTER PROPERTIES; PROBABILITY OF PEAK OVERLAP; STATISTICAL OVERLAP THEORY; TWO DIMENSIONAL SEPARATIONS;

STATISTICAL METHODS;

ARTICLE; PREDICTION; PRIORITY JOURNAL; PROBABILITY; SEPARATION TECHNIQUE; STATISTICAL ANALYSIS; THEORETICAL STUDY;

CHROMATOGRAPHY; CHROMATOGRAPHY, GAS; MODELS, THEORETICAL;

EID: 33747779783     PISSN: 00219673     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chroma.2006.05.064     Document Type: Article

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