Microstructure-property relationship in textured ZnO-based varistors

Acta Materialia

Volumn 58, Issue 12, 2010, Pages 4126-4136

  Özer, I Özgür ^a   Suvaci, Ender ^a   Bernik, Slavko ^b  

^a ANADOLU UNIVERSITY   (Turkey)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

Electrical properties; Electron backscattering diffraction; Texture; Zinc oxide

Indexed keywords

BACKSCATTERING; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; GRAIN GROWTH; MICROSTRUCTURE; SCHOTTKY BARRIER DIODES; TEXTURES; THRESHOLD VOLTAGE; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

BOUNDARY CHARACTERISTICS; ELECTRICAL CHARACTERISTIC; ELECTRON BACKSCATTERING DIFFRACTION; MICROSTRUCTURE-PROPERTY RELATIONSHIPS; ORIENTATION DISTRIBUTIONS; SCHOTTKY BARRIER HEIGHTS; STEREOLOGICAL ANALYSIS; TEMPLATED GRAIN GROWTH;

VARISTORS;

EID: 79960919387     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.04.003     Document Type: Article

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