Current-voltage characteristics of cobalt-doped inversion boundaries in zinc oxide bicrystals

Journal of the American Ceramic Society

Volumn 86, Issue 9, 2003, Pages 1616-1618

  Oba, Fumiyasu ^a   Sato, Yukio ^a   Yamamoto, Takahisa ^a   Ikuhara, Yuichi ^a   Sakuma, Taketo ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COBALT; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

COBALT-DOPED INVERSION BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERGRANULAR PHASE; ZINC OXIDE BICRYSTAL;

ZINC OXIDE;

EID: 0141973580     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2003.tb03526.x     Document Type: Article

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