SCOPUS 정보 검색 플랫폼

Volumn 158, Issue 9, 2011, Pages

Microstructure evolution during plasma electrolytic oxidation and its effects on the electrochemical properties of AZ91D Mg alloy

(6) Ryu, Hyun Sam a Mun, Seong Jae a Lim, Tae Seop a Kim, Hong Chan a Shin, Kwang Seon a Hong, Seong Hyeon a

a Seoul National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS OXIDES; CORROSION CURRENT DENSITIES; CORROSION POTENTIALS; CORROSION PROPERTY; CRYSTALLINITIES; DENSE LAYER; FLUORIDE CONTENT; MG ALLOY; MICROSTRUCTURE DEVELOPMENT; MICROSTRUCTURE EVOLUTIONS; NANOCRYSTALLINES; ORDERS OF MAGNITUDE; PLASMA ELECTROLYTIC OXIDATION; POROUS LAYERS; POTENTIODYNAMIC TESTS; POTENTIODYNAMICS; POTENTIOSTATIC TESTS;

ALLOYS; ALUMINOUS REFRACTORIES; CERIUM ALLOYS; CORROSION RESISTANCE; CRYSTALLINE MATERIALS; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROLYSIS; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSTRUCTURE; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROCHEMICAL PROPERTIES;

EID: 79960909494 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3604947 Document Type: Article

Times cited : (37)

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