Characterization of oxide films formed on Mg-based WE43 alloy using AC/DC anodization in silicate solutions

Journal of the Electrochemical Society

Volumn 151, Issue 1, 2004, Pages

  Birss, V ^a   Xia, S ^a   Yue, R ^a   Rateick Jr , Richard G ^b  

^a UNIVERSITY OF CALGARY   (Canada)

^b HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; COMPOSITION; CORROSION RESISTANCE; CURRENT DENSITY; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICATES; SOLUTIONS; THICKNESS MEASUREMENT;

ANODIZATION; BARRIER FILM THICKNESS; OXIDE FILMS;

MAGNESIUM ALLOYS;

EID: 0842311655     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1629095     Document Type: Article

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